电子科学与技术学院2017年学术报告会之三十三-A Hierarchical Multi-Classifier System for Manufactured IC Analysis
来源：电子科学与技术学院 浏览：1956 时间：2017-10-11
题目：A Hierarchical Multi-Classifier System for Manufactured IC Analysis
报告人： Deruo Cheng
Investigation of manufactured ICs plays an important role in intellectual property protection, hardware security assurance, and counterfeits detection. In recent years, the complexity of ICs has largely scaled up to meet the growing demand for electronic products, creating more challenges for IC analysis than before. For modern VLSI design, the transistor count has reached the scale of billions. It can take an experienced engineer weeks and even months to annotate the circuit components during the analysis process, while human assistance is required to define the connections between different components. Automated approaches need to be explored to replace conventional labour-intensive efforts.
This presentation will first provide an overview on manufactured IC analysis, followed by introducing the current approaches to circuit component annotation. Thereafter, a hierarchical multi-classifier system is presented to provide a versatile solution on transistor terminal detection and poly line segmentation in delayered IC images for subsequent transistor interconnection retrieval.
Deruo Cheng is currently a year 2 PhD Student in the School of Electrical and Electronic Engineering at Nanyang Technological University of Singapore, where he received the B. Eng. (1st Class Hons.) in 2016. His current research interests include computer vision, IC image analysis and hardware security.